General Gamma Spectroscopy

Optimization of Pulse Processing Parameters for HPGe Gamma-ray Spectroscopy Systems Used in Extreme Count Rate Conditions and Wide Count Rate Ranges
R.M. Keyser and T.R. Twomey, ORTEC (MARC Conference March 2012)

Metodi Avanzati di Spettrometria Gamma
Davide Sacchi, AMETEK s.r.l. (ORTEC) and Luca Albertone ARPA Piemonte (2011)

Performance of an Enhanced Throughput Feature in a High-Count Rate System
Ronald M. Keyser and Rex C. Trammell, ORTEC (2004 IEEE)

High Count Rate Spectroscopy with Ge Detectors: Quantitative Evaluation of the Performance of High Rate Systems
Timothy R. Twomey, Ronald M. Keyser, Michael L. Simpson, Sanford E. Wagner (1991)

Charge Trapping Correction in Ge Spectrometers
M.L. Simpson, T.W. Raudorf, T.J. Paulus, R.C. Trammell, EG&G ORTEC (1989 IEEE)

High-Rate and High-Energy Gamma-Ray Spectroscopy Using Charge Trapping and Ballistic Deficit Correction Circuits
M.L. Simpson, T.W. Raudorf, T.J. Paulus, R.C. Trammell, EG&G ORTEC (1989)
 

Ballistic Deficit Correction in Semiconductor Detector Spectrometers
F.S. Goulding and D.A. Landis, Lawrence Berkeley Laboratory (IEEE Transactions on Nuclear Science, Vol. 35, No. 1, February 1988)

Effect of Charge Carrier Trapping on Germanium Coaxial Detector Line Shapes
T.W. Raudorf, ORTEC; R.H. Pehl, Lawrence Berkeley Laboratory (1986)