GG8020 Octal Gate and Delay Generator

• For adjusting the delay and width of coincidence and gating pulses
• Eight, independent, duplicate channels in a compact package
• TTL outputs and NIM-standard fast-negative outputs
• Output delays independently adjustable from 70 ns to 10 µs
• Output widths independently adjustable from 70 ns to 10 µs

The ORTEC model GG8020 Octal Gate and Delay Generator provides a compact and versatile solution for gating and coincidence logic requirements in large experiments, or in measurements requiring multiple delays and pulse widths. It contains eight independent channels of gate and delay generators in a single-width NIM module.

Each channel accepts NIM-standard, fast negative logic pulses at its input. The leading edge of the input signal triggers a delay period that can be adjusted separately for each channel. At the end of the delay period, an output pulse is generated. The width of this output pulse can be adjusted independently for each channel. Delay ranges from 70 to 1000 ns, or from 0.4 to 10 µs can be selected separately for each channel by one of eight jumpers on the printed wiring board. A second set of eight jumpers independently select ranges from 70 to 1000 ns, or 0.4 to 10 µs for the output pulse widths.

Each channel produces two NIM-standard, fast negative logic pulse outputs, and one positive TTL output. The fast negative outputs provide fan-out capability, and are particularly useful for driving overlap coincidence modules that require NIM-standard, fast negative logic levels. They can also be used as delayed inputs to timing instruments, or as gating signals on modules that require fast negative inputs. The TTL output is compatible with modules requiring either TTL inputs, or NIM-standard, slow positive logic pulses. The TTL output is ideal for gating ADCs and multichannel analyzers.

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