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Photon Detector Categories Efficiency as a Function of Energy As shown in Fig. 14 (Refs. 35),
the absolute efficiency of
Germanium coaxial detectors varies with energy. The ratio of the
number of counts in the full-energy photopeak to the total number of gamma rays emitted
from a source is known as the absolute full-energy photopeak efficiency. This includes the
effect of the solid angle subtended by the detector, and thus the source-to-detector
distance. This absolute detection efficiency is a function of energy. For a gamma-ray or
x-ray to be detected, the photon must transfer part or all of its energy by one of three
interaction modes: photoelectric effect, Compton scattering, or pair production. For a
count to occur within a nuclides full-energy photopeak, all of the photons
energy must be deposited in the detectors active volume, either as a single
photoelectric interaction or as a multiple event. At 1.33 MeV, ~80% of the full-energy
counts start with a Compton interaction.At gamma-ray and x-ray energies up to ~40 keV, the relationship of efficiency to energy is dominated by the attenuation of these photons by materials outside the detector and by any dead layers on the detector periphery. For this reason, the GEM (p-type) and GAMMA-X (n-type) detectors have different responses. In GAMMA-X detectors, the 0.3-µm boron ion-implanted contact and thin beryllium front window allow photons of energy down to 3 keV to enter the active volume of the detector. Except for the anomaly at the 11-keV germanium absorption edge, virtually all photons up to 200 keV are detected. Above that energy, the efficiency falls off with the total absorption cross section of Ge, which is dominated by the fall-off in the photoelectric cross section (see Fig. 4 in "Review of the Physics of Semiconductor Detectors").Due to the 700-µm-thick Li-diffused outer contact of the GEM
detector, it experiences a fall-off of efficiency below ~100 keV, with
almost all photons below 40 keV being absorbed in the outer dead layer.
At higher
*Nucl. Instrum. Methods, 23 (1975) 5734. |