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D Series Planar
Totally Depleted Silicon Surface Barrier Detectors
Main Application: Time-of-Flight measurements with heavy
ions.
Unless specified otherwise, supplied in E Mount for 10–25 µm
thickness; in T Mount for >25 µm thickness.
(See mount descriptions.)* All standard totally depleted detectors are cut off-axis from the
parent crystal at a specific angle that will minimize channeling. Larger areas available
on special order. Other areas and depths available on special order.
** First three digits of Model No. indicate total system noise width
measured with standard ORTEC electronics and 0.5-µs shaping time constants. Noise width
is given for the smallest thickness (largest capacitance) in each range and specified
nominal area. For high-capacitance units, performance depends on actual thickness and
area.
|
Active
Area
(mm2) |
Maximum
Thickness
Variation
(µm) |
Depletion
Depth
15 µm
Range:
7–15 µm
Model No. |
Depletion
Depth
25 µm
Range:
15.1–25 µm
Model No. |
Depletion
Depth
40 µm
Range:
25.1–40 µm
Model No. |
| 10 |
±0.5 |
D-020-010-15 |
|
|
| 50 |
±0.5 |
D-035-050-15 |
D-035-050-25 |
D-020-050-40 |
| 150 |
±1.0 |
|
D-060-150-25 |
D-035-150-40 |
| 300 |
±1.0 |
|
D-095-300-25 |
D-055-300-40 |
| 450 |
±3.0 |
|
D-100-450-25 |
D-090-450-40 |
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Active
Area
(mm2) |
Maximum
Thickness
Variation
(µm) |
Depletion
Depth
50 µm
Range:
40.1–65 µm
Model No. |
Depletion
Depth
75 µm
Range:
65.1–85 µm
Model No. |
Depletion
Depth
100 µm
Range:
85.1–110 µm
Model No. |
| 50 |
±0.5 |
D-015-050-50 |
D-015-050-75 |
D-015-050-100 |
| 150 |
±1.0 |
D-030-150-50 |
D-030-150-75 |
D-025-150-100 |
| 300 |
±1.0 |
D-045-300-50 |
D-040-300-75 |
D-030-300-100 |
| 450 |
±3.0 |
D-070-450-50 |
D-060-450-75 |
D-060-450-100 |
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