Spectroscopy tools for the alpha spectroscopist:ORTEC can provide a single charged particle detector, Multichannel Analyzer (MCA), vacuum chambers, recoil contamination avoidance hardware, analytical software, or a complete turn-key integrated alpha spectroscopy system with multiple detectors. Whether it is the nuclear power counting room, radiochemistry laboratory, continuous air monitoring (CAM) or research applications, ORTEC can provide the solution to meet your needs.

The modern alpha spectroscopist requires the superior electronics, software, hardware, and procedures to provide high resolution spectra that are free from interferences. Starting with ORTEC’s ULTRA series ion implanted silicon detectors for low background and high efficiency, a wide selection of MCA hardware can be selected to process the signal. With ORTEC’s MAESTRO-32 software, the spectral data can be viewed as it is being acquired, or stored for later evaluation.  

Whether you have one detector or several hundred detectors, the AlphaVision-32 software package makes sample management, data acquisition, and data processing simple. AlphaVision also provides multi-parameter quality assurance to monitor detector performance and radiochemistry procedures. LIMS integration is also a snap, allowing for more reliable and consistent results that are free of transcription errors. 

To prevent recoil contamination from contaminating your low background detectors, ORTEC offers a Recoil Contamination Avoidance Package (RCAP).

Our time tested products for alpha spectroscopy, combined with a staff that has decades of experience in the field of spectrometry, give us the capability to help you meet your spectrometry needs.

The detectors of choice for alpha spectroscopy are ULTRAs with a depletion depth of ³100 microns and ULTRA-AS detectors for ultra-low background applications. Many established installations are equipped with reliable Ruggedized (R-Series) Surface Barrier Detectors. As these require negative bias, the U Series are not a direct replacement in alpha spectrometer units. (All other ORTEC charged-particle detectors require positive bias.)

The reasons why the ULTRA and ULTRA-AS lines are widely used in alpha spectroscopy are the following:

• Alpha spectroscopists with low activity samples often position samples as close as possible to the front detector contact. As noted above, the thin (500 Å silicon equivalent) window results in optimal energy resolution.
• The front contact is cleanable. (This is also true of R-Series Surface Barrier Detectors, but not of other surface barrier detectors.)
• The type of edge passivation used with ULTRA Series Detectors permits positioning the sample as close as 1 mm from the detector entrance contact; the minimum distance with surface barrier detectors is 2.5 mm. As, in many cases, the efficiency of the detector depends strictly on geometrical factors, ULTRA detectors provide higher efficiency than surface barrier detectors.
• The low leakage current  results in low noise, also contributing to good energy resolution.

To minimize cosmic ray interactions, ULTRA-AS series are made as thin as possible, consistent with achieving good resolution. As natural alpha particles have a range not exceeding 30 microns in silicon, it would seem that a depletion depth not exceeding 30 microns should be sufficient. It would  be were it not for the fact that such a high-capacitance detector would display excessive noise. A depletion depth close to 100 microns provides the best tradeoff.

Some alpha spectroscopists employ an alpha recoil avoidance package to reduce the tendency for a gradual increase of background contamination on the detector surface. Information on this package is contained in the description of the ORTEC RCAP-2 system.

For rough spectroscopy and for simple counting applications (as in continuous air monitors), ORTEC offers the ruggedized ULTRA CAM line. ULTRA CAM detectors are light tight and moisture resistant.

Download the ULTRA/ULTRA-AS data sheet.

Download the Ultra CAM data sheet.

AlphaVision Alpha Spectroscopy Software (A36-B32)

AlphaVision offers even more features for the busy alpha spectroscopy counting laboratory. AlphaVision provides automated control and analysis of alpha spectra, with the status of as many as 128 silicon charged-particle detectors visible at a glance on a single screen.

A wide variety of analysis procedures accommodates virtually any sample requirements encountered in alpha spectroscopy. Sample data and ANSI N13.30-compliant QA data are maintained in Access databases for report customization.

• Interactive reanalysis for "difficult" samples
• Decay correction of tracer and/or analytes
• Improved energy recalibration
• Improved Spectral plotting

AlphaVision supports ORTEC's CONNECTIONS architecture for Local Area Networking under Windows 2000/XP, thereby providing flexibility, plus data security via extensive password protection. It is compatible with all ORTEC CONNECTIONS networking products.

AlphaVision is specifically designed for use with Alpha Aria, Alpha Duo, and Alpha Ensemble alpha spectrometers. From a single spectrometer, to a complete, custom, turnkey alpha spectroscopy system, ORTEC is at your beck and call.

To further enhance the productivity of your alpha spectroscopy software, ORTEC offers Nuclide Navigator™ III Chart of the Nuclides database software. 

Download the AlphaVision data sheet.

Download the Nuclide Navigator III data sheet.

Modern Methods in Alpha Spectrometry

A Short Course in Practical Methods

The field of alpha spectrometry has seen some significant developments in recent years, both in the area of sample preparation as well as new system designs, which provide for more efficient counting and analysis. This 5-day course will begin with a review of the basics of alpha spectrometry and then present a detailed overview of some of the most useful innovations for the analyst. Real-world examples will be emphasized throughout and a "hands-on" approach will be emphasized with about 60-70% laboratory sessions. Recent groups included not only students from the U.S., but also international participants. Topics will include:

• Sources and distribution of radioactive contamination of the environment
• Basics of sample preparation for alpha spectrometry
• New approaches to sample preparation
• Redox chemistry of the actinides (separating actinides by solution chemistry)
• Use of new types of ion exchange and extraction chromatographic resins
• Source preparation techniques by electro deposition and micro precipitation techniques
• Some specific method descriptions including screening procedures
• Basics of alpha radiation, detectors, sample counting
• Recommended QA/QC practices
• Energy and efficiency calibration
• Prevention of recoil contamination
• Background and reagent blank corrections
• Nuclide activity calculations (calculations for U, Th, Pu, Am analysis)
• Propagation of counting errors, MDA’s

List of Tentative Laboratory Experiments:

1. Review of counting procedures-1 (energy calibration, pulser checks, etc.)
2. Review of counting procedures-2 (recoil prevention, efficiency, geometry considerations)
3. Calculation of theoretical counting geometries
4. Methods of coprecipitation for actinide analyses
5. U, Th, and Pu in soil via ion exchange procedures
6. Screening analysis for actinides in water via extraction chromatography
7. Preparation of counting sources by fluoride microprecipitation/filtration
8. Electrodeposition of sources and determination of electrodeposition rates
9. Calculation of sample activities, propagation of counting errors

1. Separation of U, Am, Pu from air filters via extraction chromatography
2. Radium Isotopes in water samples via alpha spectrometry